Phasics's wavefront sensing technology provides accurate on and off-axis MTF and WFE of objective lenses even with large field of view (FOV) and large chief ray angle (CRA). Metrology solutions are available from the stand-alone wavefront sensor to the fully automated test station. As all of these solutions benefit from Phasics's unique wavefront measurement technology, they perform reliable and comprehensive measurements while staying easy-to-use metrology tools. Lens test stations (integrated machines and optical test benches) and wavefront sensors are available in the UV, NIR, SWIR, MWIR, and LWIR bands. Phasics' metrology tools address the needs for lens quality control in both R&D and production.
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Measurement setup
Phasics offers an exclusive lens measurement principle in single pass. The optical setup to perform lens quality control is very simple; the wavefront is directly measured with no relay lens. Calculations then use light propagation theory to provide both wavefront aberrations and the MTF. The MTF is obtained in a single shot at any frequency without using a target or any scanning. All wavefront aberrations are also provided with this single acquisition.
Automatic field scanning and wavelength change with the Kaleo MTF
Phasics offers an exclusive lens measurement principle in single pass. The optical setup to perform lens quality control is very simple; the wavefront is directly measured with no relay lens. Calculations then use light propagation theory to provide both wavefront aberrations and the MTF. The MTF is obtained in a single shot at any frequency without using a target or any scanning. All wavefront aberrations are also provided with this single acquisition.
Measurement outputs
MTF at multiple wavelengths
On and Off axis MTF is measured at various wavelengths using KALEO MTF and QWSLI technology
Wavefront aberrations
Wavefront error is measured using KALEO MTF and QWSLI technology
Geometric & radiometric lens parameters
Geometric and radiometric lens parameters at various wavelengths using KALEO MTF and QWSLI technology
Advantages
Accurate and reproducible results
- 0.5% MTF precision
- 20 nm RMS OPD accuracy
- < 0.05% distortion repeatability
Simple measurement setup
- Direct setup: no relay lens, no null lens
- Automatic sample alignment
- Automatic wavelength switch
Complete qualification
- On and off axis MTF and TF MTF
- Multiple wavelengths
- OPD in the exit pupil
