SID4 XHR Wavefront sensor
SID4 XHR is a large aperture, extremely high resolution wavefront sensor for advanced optics and laser metrology. It combines simple implementation with a large active area and 1400 × 1000 phase sampling, enabling live full field measurements on large optical components, expanded beams and wide field assemblies. Optimized for surface inspection, high spatial frequency defect detection and optical component characterization, the SID4 XHR supports applications from lenses and objectives to aspherical and freeform optics.
Spectral Range VIS - NIR (400 - 1100 nm)
Large aperture dimension: 38.64 x 27.60 mm²
Extremely high phase sampling: 1400 x 1000
Achromaticity
SID4 XHR Wavefront sensor
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Contact usTechnical Information
| Wavelength range | 400 - 1100 nm |
| Aperture dimension | 38.64 x 27.60mm² |
| Spatial resolution | 1400 x 1000 |
| Phase sampling | 27.6 µm |
| Phase resolution | 6 nm RMS |
| Dimensions | 114 x 105 x 110 mm |
| Weight | ~1kg |
