SID4 UV Wavefront sensor
Spectral Range UV (190 - 400 nm)
Bringing high-resolution wavefront sensing as low as 190 nm, the SID4 UV is perfectly suited for UV optics testing, UV laser characterization (used in lithography or semiconductor applications), and surface inspection of lenses and wafers.
Very high resolution – 300 × 300 sampling
High sensitivity – 2 nm RMS
Affordable solution for UV wavefront measurement
SID4 UV Wavefront sensor
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Contact usTechnical Information
Cost-effective, high resolution UV wavefront sensor
| Wavelength range | 190 - 400 nm |
| Aperture dimension | 7.8 x 7.8 mm² |
| Spatial resolution | 26 µm |
| Phase and Intensity sampling | 300 x 300 |
| Resolution (Phase) | 2 nm RMS |
| Accuracy (Absolute) | 15 nm RMS |
| Acquisition rate | > 15 fps |
| Real-time processing frequency* | 2 fps (full resolution)* |
| Interface | Giga Ethernet |
| Dimensions (WxHxL) | 74 x 71 x 91 mm³ |
| Weight | ~600g |
